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Nanotechnology for the Tip-Surface Interface

In the mid-1980’s, researchers first discovered that tips could image surfaces with atomic resolution and move individual atoms on a surface.  Since then, scanning probe microscopy and nano-manipulation applications have grown exponentially and the need for enhanced tips is greater than ever.

Our mission is to create needles and tips that provide superior tip-surface contacts.  Tiptek’s probes and needles give high resolution, long life, and robust tip-surface interactions in the following three applications:

SEMICONDUCTOR FAULT DETECTION
SCANNING TUNNELING MICROSCOPY
ATOMICALLY PRECISE MANUFACTURING
Atomically precise hydrogen resist lithography (AP-HRL) demonstrated with a Tiptek probe where "TIPTEK" is written with nanometer linewidth.

NEWS

Tiptek’s DOE Success Story
February 13, 2024

We are excited to share that Tiptek has been selected for a success story Continue reading

Tiptek to Showcase Products at ISTFA 2023
August 29, 2023

Tiptek will exhibit at the 49th International Symposium for Testing and Failure Analysis November Continue reading

Tiptek Showcases Nanoprobe Product Line at IPFA 2023
July 26, 2023

Tiptek co-founder and CEO, Scott Lockledge, attended the 30th edition of the IEEE International Continue reading

EVENTS

ISTFA 2023

Phoenix, AZ, USA
November 12 - 16, 2023

Marina Bay Sands, Singapore
2024