Scanning probe microscopes (SPMs) differ from optical microscopes because the user doesn’t “see” the surface directly, instead, the tool “feels” the surface to make images of nanoscale surfaces and structures, including atoms. When rastered across a surface, Tiptek probes image and analyze surfaces with atomic and sub-atomic precision via scanning tunneling microscopy (STM) providing users with a consistent and accurate interface through its FDSS process guarantees uniformity and sharpness. Under ultra high vacuum, these instruments image and spectroscopically analyze surfaces using a tunneling current to detect proximity of the tip apex to the surface.