Tiptek LTN™ Needles
Long and microscopically thin, Tiptek LTN™ lamella transfer needles deliver cross-sections from a semiconductor chip surface to a holder for subsequent analysis by transmission electron microscopy (TEM).
Tiptek Nanoprobes
Electrically conductive and atomically sharp, Tiptek probes touch the tiniest features on semi-conductor chips and allow their electrical connectivity and characteristics to be tested.
Tiptek Scanning Probes
Rastered across a surface, Tiptek probes image and analyze surfaces with atomic and sub-atomic precision via scanning tunneling microscopy (STM).
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