Product Description

Tiptek's LTN™ needles efficiently move cross-sections of a semiconductor chip for later analysis by transmission electron microscopy (TEM).  They boost throughput by reducing time required for FIB milling and needle changes.

Omniprobe™ and EasyLift™  nanomanipulators typically use a tungsten needle that must be milled by a Focused Ion Beam (FIB) after about 3 transfers.  This operation reduces shaft diameter to a usable size.  However, milling slows throughput and requires operator time.  Tiptek's LTN™ needles require NO FIB milling until about 24 transfers have been made, boosting throughput by 8X when compared to competitors.   In addition, Tiptek LTN’s™ have 3X longer usable needle length (250 microns vs. 70 microns) when compared to competitors, reducing time between needle changes.

Tiptek LTN™ Comparison to Competitor

Tiptek LTN™ Competitor Probe
Total Usable Length
(D=15 microns)		 200-250 microns 70 microns
Length for which NO FIB Milling is required
(D=3.5 microns)		 70 microns 9 microns

Tiptek LTN™ needles for the OmniProbe™ and EasyLift™ nanomanipulators designed for high throughput and resolution applications. Materials are solid Tungsten with an extremely small taper angle. Shank diameter is 0.508mm (0.020") and nominal 13 mm length. Custom lengths available.

Features:

  1. Drop in replacement for Omniprobe™ Narrow Probe needles. 
  2. Same needle dimensions and material (tungsten).
  3. Perfectly concentric for use in automated FIB needle thinning routines.

Benefits: 

  1. Higher Throughput - 24 vs. 3 transfers without FIB milling
  2. Longer Interval Between SEM Vacuum Chamber Vent - 3X longer length/needle
  3.  More “spring.” Needles less susceptible to probe bending.
  4. Less “sharps” waste.