Tiptek STM Probes
A Scanning Tunneling Microscope (STM) images a surface with atomic resolution using an electrically biased probe. In this technique, the STM user brings the probe in close proximity to a surface and establishes a tunneling current. While holding current constant, the probe is rastered across the surface and the relief map created from this motion is a direct representation of the atomic structure of the surface. At a given location, the user may also sweep voltage and obtain highly localized information on the electronic structure of the sample in a measurement call scanning tunneling spectroscopy.
Tiptek's ultra-sharp STM probes have the following characteristics:
|Material||Cylindrical Polycrystalline Tungsten|
|Probe Diameter||0.25 mm|
|Nominal Tip Radius
|< 7 nm|
|Package Quantity||Box of 5|