Lyding elected as AAAS Fellow
In December 2014 CSL faculty member Joseph Lyding, a professor of electrical and computer engineering, was one of six University of Illinois at Urbana-Champaign faculty members to be elected 2014 Fellows of the American Association for the Advancement of Science. Lyding was honored for distinguished contributions in nanotechnology and discovery of the giant deuterium isotope effect. Lyding developed scanning tunneling microscopy (STM) hardware and techniques that are used in labs around the world to study materials and devices at the atomic scale, and he also discovered that deuterium could be
Tiptek receives Phase I SBIR funding from the National Institutes of Health
July 1, 2014 – Tiptek received Phase I SBIR funding from the National Institutes of Health for the development of improved probe tips for Biomedical Atomic Force Microscopy via Batch Wafer-Scale. This SBIR grant funds efforts to perfect and scale up a newly patented process for fabricating ultrasharp and hard probe tips for making images of biological specimens. Scanning probe microscopy (SPM) methods such as atomic force microscopy (AFM) create images of surfaces by rastering a probe across the surface. The probe itself consists of a tip (which interacts with
Lyding Receives NBIC Award
Professor Joseph W Lyding was honored with the Award for Research Excellence in Nanotechnology in October 2013. This award is accorded to one international researcher each year by Penn’s Bio/Nano Interface Center with Lyding delivering the keynote address at the NanoDays@Penn event on the University of Pennsylvania campus.
Tiptek receives Phase II SBIR funding from the National Science Foundation
February 27, 2013 – Tiptek receives Phase II SBIR funding from the National Science Foundation. This Small Business Innovation Research (SBIR) Phase II project will perfect a proprietary batch-scale processing technique for fabricating ultrahard and ultrasharp atomic force microscopy (AFM) tips. Hard, sharp tips are of considerable scientific and market interest because tip geometry and mechanical properties significantly impact the results of AFM measurements. The current project will carry out research to perfect a batch wafer-scale process able to manufacture hundreds of tips at once broader/commercial impact of the project
IEEE Fellows Announced, Lyding Among them
April 2011 – The 2011 class of IEEE Fellows includes ECE ILLINOIS professor Joseph W Lyding who joins 54 other faculty members who are also IEEE Fellows. This is the highest grade of membership in IEEE and is recognized within the scientific community as a prestigious honor that reflects an extraordinary record of achievement.