Electrically conductive and atomically sharp, Tiptek's nanoprobes touch the tiniest features on semi-conductor chips and allow their electrical connectivity and characteristics to be tested.
Tiptek’s NP nanoprobes are industry leading, tungsten-based probes with a hard, sharp, and conductive apex and a clean debris-free probe surface.
In addition to the features and benefits of NP probes, an innovative production process creates LC probes with a low contact resistance apex. This feature minimizes initial and subsequent cross cleaning and increases FA lab throughput.
|Sharp||Available with critical radii of curvature (ROC) as low as 1 nm for use in all advanced semiconductor nodes.||X||X|
|Long Life||Hard tungsten-based probes provide numerous tip surface touches||X||X|
|Conductive||Materials of construction give metallic conductivity for accurate and repeatable electrical measurements.||X||X|
|Robustly Packaged||Vacuum packed in ESD-safe water/air barrier packaging to prevent ESD damage in transit and minimize oxide formation.||X||X|
|Widely Applicable||Available for ThermoFisher Scientific nProber IV and nProber III, Imina, Kleindieke, and Hitachi nanoprober systems. Available in straight or bent configurations. Custom lengths and angles available.||X||X|
|Low-Contact Resistance||Innovative LC probes require little or no cross-cleaning before use.||X|
|Reliable & Consistent Results||Tiptek nanoprobes are dependable and improve the output, accuracy, and speed of your failure analysis workflow.||X||X|
|Repeatable||Tiptek probes are sharp and uniform for dependable results every time.||X||X|
|Guaranteed Satisfaction||If you are not fully satisfied with your use of Tiptek nanoprobes, we will replace them free of charge.||X||X|
|Increased FA Lab Throughput||Minimize time spent cross cleaning and maximize productivity.||X|
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