Product Description

Electrically conductive and atomically sharp, Tiptek's nanoprobes touch the tiniest features on semi-conductor chips and allow their electrical connectivity and characteristics to be tested.

NP Nanoprobes
Tiptek’s NP nanoprobes are industry leading, tungsten-based probes with a hard, sharp, and conductive apex and a clean debris-free probe surface.

LC Nanoprobes
In addition to the features and benefits of NP probes, an innovative production process creates LC probes with a low contact resistance apex. This feature minimizes initial and subsequent cross cleaning and increases FA lab throughput.

Features NP LC
Sharp Available with critical radii of curvature (ROC) as low as 1 nm for use in all advanced semiconductor nodes. X X
Long Life Hard tungsten-based probes provide numerous tip surface touches X X
Conductive Materials of construction give metallic conductivity for accurate and repeatable electrical measurements. X X
Robustly Packaged Vacuum packed in ESD-safe water/air barrier packaging to prevent ESD damage in transit and minimize oxide formation. X X
Widely Applicable Available for ThermoFisher Scientific nProber IV and nProber III, Imina, Kleindieke, and Hitachi nanoprober systems. Available in straight or bent configurations. Custom lengths and angles available. X X
Low-Contact Resistance Innovative LC probes require little or no cross-cleaning before use. X
Benefits NP LC
Reliable & Consistent Results Tiptek nanoprobes are dependable and improve the output, accuracy, and speed of your failure analysis workflow. X X
Repeatable Tiptek probes are sharp and uniform for dependable results every time. X X
Guaranteed Satisfaction If you are not fully satisfied with your use of Tiptek nanoprobes, we will replace them free of charge. X X
Increased FA Lab Throughput Minimize time spent cross cleaning and maximize productivity. X

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